A Fault-Tolerant Alternative to Lockstep Triple Modular Redundancy
Semiconductor manufacturing defects adversely affect yield and reliability. Manufacturers expend vast resources to reduce defects within their processes. As the minimum feature size get smaller, defects become increasingly difficult to prevent. Defects can change the behavior of a logic circuit resu...
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| Format: | Others |
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PDXScholar
2012
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| Online Access: | https://pdxscholar.library.pdx.edu/open_access_etds/331 https://pdxscholar.library.pdx.edu/cgi/viewcontent.cgi?article=1330&context=open_access_etds |