Test methods and custom hardware for functional testing of a high speed GaAs DRAM
Approved for public release; distribution is unlimited. === The goal of this project is to produce a digital circuit operating near a frequency of 250 MHz to test a new experimental Gallium Arsenide (GaAs) Dynamic Random Access Memory (DRAM). This thesis presents the design of the digital circuit us...
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| Language: | en_US |
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Monterey, California. Naval Postgraduate School
2014
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| Online Access: | http://hdl.handle.net/10945/39922 |