Design, fabrication, and assembly of a test platform for a high-speed GaAs DRAM VLSI IC

The goal of this project is to redesign, fabricate, and assemble a digital circuit operating near a frequency of 250 MHz to test a new experimental Gallium Arsenide (GaAs) Dynamic Random Access Memory (DRAM). This thesis presents the redesigned six-layer printed circuit test fixture and the design o...

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Bibliographic Details
Main Author: Ginter, Byron A.
Other Authors: Fouts, Douglas J.
Language:en_US
Published: Monterey, California. Naval Postgraduate School 2013
Online Access:http://hdl.handle.net/10945/30816

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