| Summary: | Approved for public release; distribution is unlimited === In this research, continuing evidence that composite operational amplifiers perform better than single amplifiers in both gain bandwidth product and slew rate is presented through an approach of using computer simulation to predict ionizing radiation degradation. This technique examines the use of varying transistor parameters within PSPICE modeled composite and single operational amplifier circuits in order to simulate ionizing radiation. A comparison of the results of this simulation with those of previous research, in which composite and single operational amplifiers were irradiated with a LINAC, verifies that this simulation technique provides a reasonable prediction of a response to ionizing radiation for circuits comprised of radiation hardened components. And, in the process of validating this technique, these simulation results verify that composite operational amplifiers offer an improved bandwidth and a faster slewrate compared to single operational amplifiers
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