An analysis of aliasing in built-in self test procedure.
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Monterey, California. Naval Postgraduate School
2013
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Online Access: | http://hdl.handle.net/10945/27945 |
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ndltd-nps.edu-oai-calhoun.nps.edu-10945-279452015-08-30T16:00:54Z An analysis of aliasing in built-in self test procedure. Barus, Jasa Yang, Chyan NA NA Electrical Engineering 2013-02-15T23:29:44Z 2013-02-15T23:29:44Z 1991 Thesis http://hdl.handle.net/10945/27945 ocm227777844 en_US Monterey, California. Naval Postgraduate School |
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NDLTD |
language |
en_US |
sources |
NDLTD |
author2 |
Yang, Chyan |
author_facet |
Yang, Chyan Barus, Jasa |
author |
Barus, Jasa |
spellingShingle |
Barus, Jasa An analysis of aliasing in built-in self test procedure. |
author_sort |
Barus, Jasa |
title |
An analysis of aliasing in built-in self test procedure. |
title_short |
An analysis of aliasing in built-in self test procedure. |
title_full |
An analysis of aliasing in built-in self test procedure. |
title_fullStr |
An analysis of aliasing in built-in self test procedure. |
title_full_unstemmed |
An analysis of aliasing in built-in self test procedure. |
title_sort |
analysis of aliasing in built-in self test procedure. |
publisher |
Monterey, California. Naval Postgraduate School |
publishDate |
2013 |
url |
http://hdl.handle.net/10945/27945 |
work_keys_str_mv |
AT barusjasa ananalysisofaliasinginbuiltinselftestprocedure AT barusjasa analysisofaliasinginbuiltinselftestprocedure |
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1716817640625799168 |