Direct imaging of minority charge carrier transport in triple junction solar cell layers
An optical, contact-free method for measuring minority carrier diffusion lengths is developed and demonstrated for a range of semiconductor materials used in high efficiency triple junction solar cells. This method uses a Scanning Electron Microscope (SEM) coupled with an optical microscope. The...
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Monterey California. Naval Postgraduate School
2012
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| Online Access: | http://hdl.handle.net/10945/2472 |