A digital hardware test system analysis with test vector translation
Approved for public release; distribution is unlimited === Digital logic testing occurs in two different test environments, digital simulation and actual hardware testing. A computer aided design (CAD) tool applies a set of stimulus/response test vector patterns to check the functionality of a digi...
Main Author: | Loeblein, James T. |
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Other Authors: | Lee, Chin-Hwa |
Language: | en_US |
Published: |
Monterey, California. Naval Postgraduate School
2012
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Online Access: | http://hdl.handle.net/10945/23643 |
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