Testing methods for integrated circuit chips.
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| Language: | en_US |
| Published: |
2012
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| Online Access: | http://hdl.handle.net/10945/22144 |
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ndltd-nps.edu-oai-calhoun.nps.edu-10945-22144 |
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ndltd-nps.edu-oai-calhoun.nps.edu-10945-221442014-11-27T16:14:39Z Testing methods for integrated circuit chips. Betoner, Zafer NA NA NA NA 2012-11-27T00:18:26Z 2012-11-27T00:18:26Z 1986 Thesis http://hdl.handle.net/10945/22144 ocm641007588 en_US |
| collection |
NDLTD |
| language |
en_US |
| sources |
NDLTD |
| author2 |
NA |
| author_facet |
NA Betoner, Zafer |
| author |
Betoner, Zafer |
| spellingShingle |
Betoner, Zafer Testing methods for integrated circuit chips. |
| author_sort |
Betoner, Zafer |
| title |
Testing methods for integrated circuit chips. |
| title_short |
Testing methods for integrated circuit chips. |
| title_full |
Testing methods for integrated circuit chips. |
| title_fullStr |
Testing methods for integrated circuit chips. |
| title_full_unstemmed |
Testing methods for integrated circuit chips. |
| title_sort |
testing methods for integrated circuit chips. |
| publishDate |
2012 |
| url |
http://hdl.handle.net/10945/22144 |
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AT betonerzafer testingmethodsforintegratedcircuitchips |
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