A study of permanent electron beam radiation effects on thin film single junction quantum interferometer devices.

A study of permanent electron beam radiation effects on thin film single junction quantum interferometer devices.

Bibliographic Details
Main Author:	Welsh, Richard Gerald Thomas.
Other Authors:	NA
Language:	en_US
Published:	Monterey, California. Naval Postgraduate School 2012
Online Access:	http://hdl.handle.net/10945/16386

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