Electrical Impedance Tomography (EIT): The Establishment of a Dual Current Stimulation EIT System for Improved Image Quality

• Main Author: America, Ezra Luke
• Other Authors: Tšoeu, Mohohlo
• Format: Dissertation
• Language: English
• Published: University of Cape Town 2019
• Subjects: Engineering
• Online Access: http://hdl.handle.net/11427/29402

Electrical Impedance Tomography (EIT) is a noninvasive imaging technique that reproduces images of cross-sections, based on the internal impedance distribution of an object. This Dissertation investigates and confirms the use of a dual current stimulation EIT (DCS EIT) system. The results of this investigation presented a size error of 2.82 % and a position error of 5.93 % in the reconstructed images, when compared to the actual size and position of the anomaly inside a test object. These results confirmed that the DCS EIT system produced images of superior quality (fewer image reconstruction errors) to those produced from reviewed single plane stimulating EIT systems, which confirmed the research hypothesis. This system incorporates two independent current stimulating patterns, which establishes a more even distribution of current in the test object, compared to single plane systems, and is more efficient than 2.5D EIT systems because the DCS EIT system only measures boundary voltages in the center plane, compared to 2.5D EIT systems that measure the boundary voltages in all electrode planes. The system uses 48 compound electrodes, divided into three electrode planes. Current is sourced and sunk perpendicularly in the center plane, to produce a high current density near the center of the test object. Sequentially, current is sourced through an electrode in the top electrode plane and sunk through an electrode in the bottom plane, directly below the source electrode, to produce a high current density near the boundary of the test object, in the center plane. During both injection cycles, boundary potentials are measured in the center plane. Following the measurement of a complete frame, a weighted average is computed from the single and cross plane measured data. The weighted measured voltages, injected currents and Finite Element Model of the object is used to reconstruct an image of the internal impedance distribution along a cross-section of the object. This method is applicable to the biomedical imaging and process monitoring fields.