Genetic Mapping of Quantitative Trait Loci for Resistance to Wheat Tan Spot Using Two Bi-Parental Populations

Tan spot, caused by Pyrenophora tritici-repentis (Ptr), is an economically important disease on both common wheat (Triticum aestivum L.) and durum (T. turgidum L. ssp. durum). Genetics of resistance to tan spot is complicated and needs to be further investigated for breeding cultivars with more comp...

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Main Author: Kariyawasam, Gayan Kanishka
Format: Others
Published: North Dakota State University 2018
Online Access:https://hdl.handle.net/10365/27872
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spelling ndltd-ndsu.edu-oai-library.ndsu.edu-10365-278722021-09-28T17:10:58Z Genetic Mapping of Quantitative Trait Loci for Resistance to Wheat Tan Spot Using Two Bi-Parental Populations Kariyawasam, Gayan Kanishka Tan spot, caused by Pyrenophora tritici-repentis (Ptr), is an economically important disease on both common wheat (Triticum aestivum L.) and durum (T. turgidum L. ssp. durum). Genetics of resistance to tan spot is complicated and needs to be further investigated for breeding cultivars with more complete resistance. The objective of this study was to map and characterize genetic resistance in two wheat bi-parental popuations. In Louise × Penawawa population, four quantative trait loci (QTL) were identified and the major race-nonspecific QTL, designated as QTs.zhl-3BL, was shown to have epistatis and additive effect on Ptr ToxA-Tsn1, Ptr ToxC-Tsc1 interactions, respectively. Nine QTL were identified in the Lebsock × PI 94749 population with three likely being novel. This work improves our understanding of genetic resistance to tan spot and provides important tools for breeding resistant cultivars. 2018-03-27T18:07:41Z 2018-03-27T18:07:41Z 2015 text/thesis https://hdl.handle.net/10365/27872 NDSU policy 190.6.2 https://www.ndsu.edu/fileadmin/policy/190.pdf application/pdf North Dakota State University
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format Others
sources NDLTD
description Tan spot, caused by Pyrenophora tritici-repentis (Ptr), is an economically important disease on both common wheat (Triticum aestivum L.) and durum (T. turgidum L. ssp. durum). Genetics of resistance to tan spot is complicated and needs to be further investigated for breeding cultivars with more complete resistance. The objective of this study was to map and characterize genetic resistance in two wheat bi-parental popuations. In Louise × Penawawa population, four quantative trait loci (QTL) were identified and the major race-nonspecific QTL, designated as QTs.zhl-3BL, was shown to have epistatis and additive effect on Ptr ToxA-Tsn1, Ptr ToxC-Tsc1 interactions, respectively. Nine QTL were identified in the Lebsock × PI 94749 population with three likely being novel. This work improves our understanding of genetic resistance to tan spot and provides important tools for breeding resistant cultivars.
author Kariyawasam, Gayan Kanishka
spellingShingle Kariyawasam, Gayan Kanishka
Genetic Mapping of Quantitative Trait Loci for Resistance to Wheat Tan Spot Using Two Bi-Parental Populations
author_facet Kariyawasam, Gayan Kanishka
author_sort Kariyawasam, Gayan Kanishka
title Genetic Mapping of Quantitative Trait Loci for Resistance to Wheat Tan Spot Using Two Bi-Parental Populations
title_short Genetic Mapping of Quantitative Trait Loci for Resistance to Wheat Tan Spot Using Two Bi-Parental Populations
title_full Genetic Mapping of Quantitative Trait Loci for Resistance to Wheat Tan Spot Using Two Bi-Parental Populations
title_fullStr Genetic Mapping of Quantitative Trait Loci for Resistance to Wheat Tan Spot Using Two Bi-Parental Populations
title_full_unstemmed Genetic Mapping of Quantitative Trait Loci for Resistance to Wheat Tan Spot Using Two Bi-Parental Populations
title_sort genetic mapping of quantitative trait loci for resistance to wheat tan spot using two bi-parental populations
publisher North Dakota State University
publishDate 2018
url https://hdl.handle.net/10365/27872
work_keys_str_mv AT kariyawasamgayankanishka geneticmappingofquantitativetraitlociforresistancetowheattanspotusingtwobiparentalpopulations
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