Photothermal deflection spectroscopy of novel electronic materials

Bibliographic Details
Main Author: Chan, Mau Hing
Format: Others
Language:English
Published: HKBU Institutional Repository 1996
Subjects:
Online Access:http://repository.hkbu.edu.hk/etd_ra/66
http://repository.hkbu.edu.hk/cgi/viewcontent.cgi?article=1065&context=etd_ra
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spelling ndltd-hkbu.edu.hk-oai-repository.hkbu.edu.hk-etd_ra-10652017-08-30T03:52:31Z Photothermal deflection spectroscopy of novel electronic materials Chan, Mau Hing 1996-01-01T08:00:00Z text application/pdf http://repository.hkbu.edu.hk/etd_ra/66 http://repository.hkbu.edu.hk/cgi/viewcontent.cgi?article=1065&context=etd_ra The author retains all rights to this work. The author has signed an agreement granting HKBU a non-exclusive license to archive and distribute their thesis. Restricted Access Theses and Dissertations English HKBU Institutional Repository Atomic absorption spectroscopy Photothermal spectroscopy Spectrum analysis
collection NDLTD
language English
format Others
sources NDLTD
topic Atomic absorption spectroscopy
Photothermal spectroscopy
Spectrum analysis
spellingShingle Atomic absorption spectroscopy
Photothermal spectroscopy
Spectrum analysis
Chan, Mau Hing
Photothermal deflection spectroscopy of novel electronic materials
author Chan, Mau Hing
author_facet Chan, Mau Hing
author_sort Chan, Mau Hing
title Photothermal deflection spectroscopy of novel electronic materials
title_short Photothermal deflection spectroscopy of novel electronic materials
title_full Photothermal deflection spectroscopy of novel electronic materials
title_fullStr Photothermal deflection spectroscopy of novel electronic materials
title_full_unstemmed Photothermal deflection spectroscopy of novel electronic materials
title_sort photothermal deflection spectroscopy of novel electronic materials
publisher HKBU Institutional Repository
publishDate 1996
url http://repository.hkbu.edu.hk/etd_ra/66
http://repository.hkbu.edu.hk/cgi/viewcontent.cgi?article=1065&context=etd_ra
work_keys_str_mv AT chanmauhing photothermaldeflectionspectroscopyofnovelelectronicmaterials
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