Estimation and Sequential Monitoring of Nonlinear Functional Responses Using Wavelet Shrinkage
Statistical process control (SPC) is widely used in industrial settings to monitor processes for shifts in their distributions. SPC is generally thought of in two distinct phases: Phase I, in which historical data is analyzed in order to establish an in-control process, and Phase II, in which new da...
Other Authors: | Cuevas, Jordan, 1984- (authoraut) |
---|---|
Format: | Others |
Language: | English English |
Published: |
Florida State University
|
Subjects: | |
Online Access: | http://purl.flvc.org/fsu/fd/FSU_migr_etd-4788 |
Similar Items
- Wavelet-Based Bayesian Approaches to Sequential Profile Monitoring
-
Contributions to Bayesian wavelet shrinkage
by: Remenyi, Norbert
Published: (2013) -
Autocorrelation-based factor analysis and nonlinear shrinkage estimation of large integrated covariance matrix
by: Hu, Qilin
Published: (2016) -
Comparison of ridge and other shrinkage estimation techniques
by: Vumbukani, Bokang C
Published: (2014) -
Sequential estimation procedures for binary response
by: Kershaw, Christopher David
Published: (1983)