Compositional Analysis of Complex Organic Mixtures by Electrospray Ionization Fourier Transform Ion Cyclotron Resonance Mass Spectrometry
Fourier transform ion cyclotron resonance mass spectrometry (FT-ICR MS) has ultrahigh mass resolving power (m/Dm50% >300,000) and high mass accuracy (300,000) and high mass accuracy (ppm), which enables separation and identification of elemental compositions of complicated mixture. Electrospray i...
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Format: | Others |
Language: | English English |
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Florida State University
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Online Access: | http://purl.flvc.org/fsu/fd/FSU_migr_etd-0710 |
Summary: | Fourier transform ion cyclotron resonance mass spectrometry (FT-ICR MS) has ultrahigh mass resolving power (m/Dm50% >300,000) and high mass accuracy (300,000) and high mass accuracy (ppm), which enables separation and identification of elemental compositions of complicated mixture. Electrospray ionization (ESI) provides selective ionization of polar heteroatomic compounds without chromatographic isolation. In addition, Kendrick mass plot is introduced in petrochemical analysis for an easy and fast data reduction. We first applied ESI FT-ICR mass spectrometry to the analysis of petrochemical samples like coal extracts and crude oils then extended this work into other complex mixtures, such as vegetable oils, hydrotreated fuels and military explosives. Detailed elemental compositions can be used as "fingerprint" to characterize each mixture sample. Three-dimensional van Krevelen diagram can be applied to characterize different fossil fuels. We demonstrate the great potential of ESI-FT-ICR MS in analysis of complex organic mixtures. === A Dissertation submitted to the Department of Chemistry and Biochemistry in Partial
Fulfillment of the Requirements for the Degree of Doctor of Philosophy. === Degree Awarded: Spring Semester, 2004. === Date of Defense: April 7, 2004. === Kendrick Mass, Oil, Explosives, Adulteration, Van Krevelen Diagram, ESI, FT-ICR === Includes bibliographical references. === Alan G. Marshall, Professor Directing Dissertation; William M. Landing, Outside Committee Member; William T. Cooper, Committee Member; Timothy A. Cross, Committee Member; Ryan P. Rodgers, Committee Member. |
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