A heuristic algorithm to generate test program sequences for moving probe electronic test equipment
The electronics industry, is experiencing two trends one of which is the drive towards miniaturization of electronic products. The in-circuit testing predominantly used for continuity testing of printed circuit boards (PCB) can no longer meet the demands of smaller size circuits. This has lead to th...
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FIU Digital Commons
2001
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| Online Access: | http://digitalcommons.fiu.edu/etd/1317 http://digitalcommons.fiu.edu/cgi/viewcontent.cgi?article=2451&context=etd |