Investigation of strain and spacer effects on transport property of La0.67Sr0.33MnO3 films doped with Pr0.67Ca0.33MnO3 and their multilayers.
Cheung, Wing Kin = 應變及間隔效應對La0.67Sr0.33MnO3摻雜Pr0.67Ca0.33MnO3的傳導特性的影響之研究 / 張榮健. === On t.p. "0.67", "0.33" and "3" are subscripts. === Thesis (M.Phil.)--Chinese University of Hong Kong, 2007. === Includes bibliographical references (leaves 89-93). === Text in English; a...
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Format: | Others |
Language: | English Chinese |
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2007
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Online Access: | http://library.cuhk.edu.hk/record=b5893367 http://repository.lib.cuhk.edu.hk/en/item/cuhk-326070 |
Summary: | Cheung, Wing Kin = 應變及間隔效應對La0.67Sr0.33MnO3摻雜Pr0.67Ca0.33MnO3的傳導特性的影響之研究 / 張榮健. === On t.p. "0.67", "0.33" and "3" are subscripts. === Thesis (M.Phil.)--Chinese University of Hong Kong, 2007. === Includes bibliographical references (leaves 89-93). === Text in English; abstracts in English and Chinese. === Cheung, Wing Kin = Ying bian ji jian ge xiao ying dui La0.67Sr0.33MnO3 shan za Pr0.67Ca0.33MnO3 de chuan dao te xing de ying xiang zhi yan jiu / Zhang Rongjian. === Chapter 1 --- Introduction --- p.1 === Chapter 1.1 --- Development of magnetoresistance materials --- p.1 === Chapter 1.2 --- What is magnetoresistance? --- p.1 === Chapter 1.2.1 --- Anisotropic magnetoresistance --- p.2 === Chapter 1.2.2 --- Giant magnetoresistance (GMR) --- p.3 === Chapter 1.2.3 --- Colossal magnetoresistance (CMR) --- p.4 === Chapter 1.3 --- Possible origins of CMR in manganites --- p.6 === Chapter 1.3.1 --- Tolerance factor --- p.6 === Chapter 1.3.2 --- Double exchange mechanism --- p.8 === Chapter 1.3.3 --- Jahn-Teller distortion --- p.11 === Chapter 1.3.4 --- Charge-ordering and phase separation --- p.13 === Chapter 1.4 --- Movtiation --- p.17 === Chapter 1.5 --- Literature review --- p.18 === Chapter 1.5.1 --- Single-layer manganite thin films --- p.18 === Chapter 1.5.2 --- Multilayer system - manganites with insulating spacers --- p.19 === Chapter 1.6 --- Scope of thesis --- p.20 === Chapter 2 --- Instrumentation --- p.21 === Chapter 2.1 --- Sample preparation --- p.21 === Chapter 2.1.1 --- Facing-target sputtering technique (FTS) --- p.21 === Chapter 2.1.2 --- Deposition system --- p.24 === Chapter 2.2 --- Annealing system --- p.26 === Chapter 2.2.1 --- Oxygen annealing --- p.26 === Chapter 2.3 --- Sample characterization --- p.28 === Chapter 2.3.1 --- X-ray diffraction (XRD) --- p.28 === Chapter 2.3.2 --- Alpha - step profiler --- p.30 === Chapter 2.3.3 --- Transport property measurement --- p.30 === Chapter 3 --- Preparation and characterization of single-layer thin films --- p.32 === Chapter 3.1 --- Introduction --- p.32 === Chapter 3.2 --- Fabrication and characteristization of the sputtering targets --- p.32 === Chapter 3.3 --- Deposition procedure --- p.36 === Chapter 3.3.1 --- Preparation of substrate --- p.36 === Chapter 3.3.2 --- Deposition process --- p.36 === Chapter 3.4 --- Parameters related to epitaxial growth of LPSCMO thin films --- p.37 === Chapter 3.4.1 --- Substrate materials --- p.37 === Chapter 3.4.2 --- Substrate temperature --- p.38 === Chapter 3.4.3 --- Oxygen partial pressure --- p.38 === Chapter 4 --- Thickness and strain effects in epitaxial LPSCMO thin films --- p.43 === Chapter 4.1 --- Introduction --- p.43 === Chapter 4.2 --- Structural characterization of LPSCMO thin films --- p.45 === Chapter 4.2.1 --- Thickness effect --- p.45 === Chapter 4.2.2 --- Strain effect --- p.49 === Chapter 4.3 --- Transport properties and magnetoresistance measurement --- p.51 === Chapter 4.3.1 --- Thickness effect --- p.51 === Chapter 4.3.2 --- Strain effect --- p.60 === Chapter 4.4 --- Discussion --- p.63 === Chapter 5 --- Effect of spacer in [LPSCMO/SCuO] multilayer --- p.65 === Chapter 5.1 --- Sample preparation --- p.65 === Chapter 5.2 --- Characterization of as-deposited multilayer samples --- p.67 === Chapter 5.2.1 --- Structural anaylsis --- p.67 === Chapter 5.2.2 --- Resistance measurement --- p.72 === Chapter 5.3 --- Oxygen-annealing treatment --- p.76 === Chapter 5.3.1 --- Introduction --- p.76 === Chapter 5.3.2 --- Structural anaylsis --- p.77 === Chapter 5.3.3 --- Resistance measurement --- p.78 === Chapter 5.4 --- Discussion --- p.85 === Chapter 6 --- Conclusion --- p.87 === Chapter 6.1 --- Summary --- p.87 === Chapter 6.2 --- Future outlook --- p.88 === Bibliography --- p.89 |
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