Finding the minimum test set with the optimum number of internal probe points.

• Other Authors: Kwan, Wai Wing Eric.
• Format: Others
• Language: English
• Published: Chinese University of Hong Kong 1996
• Subjects: Semiconductors > Testing; Electron beams; Scanning electron microscopes
• Online Access: http://library.cuhk.edu.hk/record=b5888785; http://repository.lib.cuhk.edu.hk/en/item/cuhk-321567

by Kwan Wai Wing Eric. === Thesis (M.Phil.)--Chinese University of Hong Kong, 1996. === Includes bibliographical references. === ABSTRACT === ACKNOWLEDGMENT === LIST OF FIGURES === LIST OF TABLES === Chapter Chapter 1 --- Introduction === Chapter 1.1 --- Background --- p.1-1 === Chapter 1.2 --- E-Beam testing and test generation algorithm --- p.1-2 === Chapter 1.3 --- Motivation of this research --- p.1-4 === Chapter 1.4 --- Out-of-kilter Algorithm --- p.1-6 === Chapter 1.5 --- Outline of the remaining chapter --- p.1-7 === Chapter Chapter 2 --- Electron Beam Testing === Chapter 2.1 --- Background and Theory --- p.2-1 === Chapter 2.2 --- Principles and Instrumentation --- p.2-4 === Chapter 2.3 --- Implication of internal IC testing --- p.2-6 === Chapter 2.4 --- Advantage of Electron Beam Testing --- p.2-7 === Chapter Chapter 3 --- An exhaustive method to minimize test sets === Chapter 3.1 --- Basic Principles --- p.3-1 === Chapter 3.1.1 --- Controllability and Observability --- p.3-1 === Chapter 3.1.2 --- Single Stuck at Fault Model --- p.3-2 === Chapter 3.2 --- Fault Dictionary --- p.3-4 === Chapter 3.2.1 --- Input Format --- p.3-4 === Chapter 3.2.2 --- Critical Path Generation --- p.3-6 === Chapter 3.2.3 --- Probe point insertion --- p.3-8 === Chapter 3.2.4 --- Formation of Fault Dictionary --- p.3-9 === Chapter Chapter 4 --- Mathematical Model - Out-of-kilter algorithm === Chapter 4.1 --- Network Model --- p.4-1 === Chapter 4.2 --- Linear programming model --- p.4-3 === Chapter 4.3 --- Kilter states --- p.4-5 === Chapter 4.4 --- Flow change --- p.4-7 === Chapter 4.5 --- Potential change --- p.4-9 === Chapter 4.6 --- Summary and Conclusion --- p.4-10 === Chapter Chapter 5 --- Apply Mathematical Method to minimize test sets === Chapter 5.1 --- Implementation of OKA to the Fault Dictionary --- p.5-1 === Chapter 5.2 --- Minimize test set and optimize internal probings / probe points --- p.5-5 === Chapter 5.2.1 --- Minimize the number of test vectors --- p.5-5 === Chapter 5.2.2 --- Find the optimum number of internal probings --- p.5-8 === Chapter 5.2.3 --- Find the optimum number of internal probe points --- p.5-11 === Chapter 5.3 --- Fixed number of internal probings/probe points --- p.5-12 === Chapter 5.4 --- True minimum test set and optimum probing/ probe point --- p.5-14 === Chapter Chapter 6 --- Implementation and work examples === Chapter 6.1 --- Generation of Fault Dictionary --- p.6-1 === Chapter 6.2 --- Finding the minimum test set without internal probe point --- p.6-5 === Chapter 6.3.1 --- Finding the minimum test set with optimum internal probing --- p.6-10 === Chapter 6.3.2 --- Finding the minimum test set with optimum internal probe point --- p.6-24 === Chapter 6.4 --- Finding the minimum test set by fixing the number of internal probings at 2 --- p.6-26 === Chapter 6.5 --- Program Description --- p.6-35 === Chapter Chapter 7 --- Realistic approach to find the minimum solution === Chapter 7.1 --- Problem arising in exhaustive method --- p.7-1 === Chapter 7.2 --- Improvement work on existing test generation algorithm --- p.7-2 === Chapter 7.3 --- Reduce the search set --- p.7-5 === Chapter 7.3.1 --- Making the Fault Dictionary from existing test generation algorithm --- p.7-5 === Chapter 7.3.2 --- Making the Fault Dictionary by random generation --- p.7-9 === Chapter Chapter 8 --- Conclusions === Chapter 8.1 --- Summary of Results --- p.8-1 === Chapter 8.2 --- Further Research --- p.8-5 === REFERENCES --- p.R-1 === Chapter Appendix A --- Fault Dictionary of circuit SC1 --- p.A-1 === Chapter Appendix B --- Fault Dictionary of circuit SC7 --- p.B-1 === Chapter Appendix C --- Simple Circuits Layout --- p.C-1