Characterizing the atomic structure in low concentrations of weakly ordered, weakly scattering materials using the pair distribution function
Nanoscale structural characterization is critical to understanding the physical underpinnings of properties and behavior in materials with technological applications. The work herein shows how the pair distribution function technique can be applied to x-ray total scattering data for material systems...
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| Language: | English |
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2018
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| Online Access: | https://doi.org/10.7916/D8GB2GNW |