Surface X-ray diffraction studies of electrode/vacuum and electrode/electrolyte interfaces

This thesis presents in situ Surface X-ray Diffraction (SXRD) studies of surfaces and interfaces, in both Ultra High Vacuum (UHV) and an electrochemical environment. Primarily Crystal Truncation Rod (CTR) measurements are utilised to determine a model for the atomic structure at the interface. A SXR...

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Bibliographic Details
Main Author: Cocklin, E. M.
Other Authors: Martin, D. ; Lucas, C. A.
Published: University of Liverpool 2017
Subjects:
530
Online Access:https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.762686