The development of multivariate analysis methodologies for complex ToF-SIMS datasets : applications to materials science
Secondary ion mass spectrometry (SIMS) is a technique that has evolved to be one of the most powerful techniques for the analysis of organic samples. Modern instruments are capable of obtaining three-dimensional information with high spatial resolution of a material with information as rich as a ful...
| Main Author: | |
|---|---|
| Other Authors: | |
| Published: |
University of Surrey
2018
|
| Online Access: | https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.742112 |