Microchip ion traps with high magnetic field gradients for microwave quantum logic

• Main Author: Murgia, David
• Other Authors: Hensinger, Winfried ; Thompson, Richard
• Published: Imperial College London 2016
• Subjects: 621.3815
• Online Access: https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.718412

This thesis describes experimental work towards the development of a trapped-ion quantum computer based on microchip ion traps and long-wavelength radiation, using magnetic field gradients. The relationship between experimental parameters and two-qubit gate fidelity is investigated for microchips with two different static magnetic field gradient generation methods. For current-carrying wires and under-chip permanent magnets, optimum ion heights of 110 μm and 200 μm are found respectively. Construction of an experiment capable of demonstrating high-fidelity gates is reported, including innovations for the use of microchip ion traps with permanent magnets. The development of a vacuum system for versatile microchip experiments is described, including new methods for impedance-matched RF delivery, in-vacuum filtering and liquid nitrogen microchip cooling. Protection of both the microchip surface from atomic flux and of ions from the charged imaging viewport are both investigated in detail. A new preparation framework for microchip ion traps before their use in experiments is developed. In order to remove unwanted deposited layers on the microchips, a process of multiple chemical treatments is used. In addition, these characterisation efforts lead to refinement of the microfabrication process for future microchips. The application of large currents to microchips is of fundamental importance to scalable trapped-ion quantum computing using static magnetic field gradients. As part of the characterisation process, currents of ≈ 10A are successfully applied to microfabricated current-carrying wires, demonstrating the viability of these structures for generation of local magnetic fields and gradients in a quantum computing device. The operation of a microchip ion trap experiment with under-chip permanent magnets for a high magnetic field gradient (≈ 140Tm−1) is described. The successful trapping of ytterbium-174 and -171 ions is reported, as well as their use to measure and optimise the ion trap parameters. The thesis concludes with consideration of the expected future results from the ongoing operation of the experiment.