Scanning probe energy loss spectroscopy (SPELS) of structured surfaces
In scanning probe energy loss spectroscopy (SPELS) an STM tip is used as a localised source of field emitted electrons by applying a high voltage. Energy loss measurements of the backscattered electrons provide spectroscopic information from the sample. The energy resolution is ≈0.3eV. In principle,...
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University of Birmingham
2015
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| Online Access: | https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.659151 |