Applications of scattering-type scanning near-field optical microscopy in the infrared
This thesis is split into two broad sections. These are defined by the various applications of scattering-type near-field optical microscopy (s-SNOM) in different parts of the electromagnetic spectrum; the near-infrared (700 - 1000nm) and the mid-infrared (6 - 10um). S-SNOM is a means of imaging sur...
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Imperial College London
2013
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.650595 |