Surface integrity through tomographic reconstruction
The capability of high resolution, low energy backscattered electron microscopy has been extended to enable serial sectioning in the chamber of a conventional scanning electron microscope. For the first time, this technique, employed in a commercially available 3View facility, is used to reveal the...
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University of Manchester
2015
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.647399 |