Dielectric characterization using resonances in high Tc Josephson junction circuits

Dielectric characterization using resonances in high Tc Josephson junction circuits

Bibliographic Details
Main Author:	Sinha, Urbasi
Published:	University of Cambridge 2007
Subjects:	669
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.612744

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