Study of failure and degradation mechanisms of III-nitride laser diodes grown by molecular beam epitaxy

Bibliographic Details
Main Author:	Xiu, Huixin
Published:	University of Cambridge 2009
Subjects:	669
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611245

id	ndltd-bl.uk-oai-ethos.bl.uk-611245
record_format	oai_dc
spelling	ndltd-bl.uk-oai-ethos.bl.uk-6112452015-11-03T04:13:42ZStudy of failure and degradation mechanisms of III-nitride laser diodes grown by molecular beam epitaxyXiu, Huixin2009669University of Cambridgehttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611245Electronic Thesis or Dissertation
collection	NDLTD
sources	NDLTD
topic	669
spellingShingle	669 Xiu, Huixin Study of failure and degradation mechanisms of III-nitride laser diodes grown by molecular beam epitaxy
author	Xiu, Huixin
author_facet	Xiu, Huixin
author_sort	Xiu, Huixin
title	Study of failure and degradation mechanisms of III-nitride laser diodes grown by molecular beam epitaxy
title_short	Study of failure and degradation mechanisms of III-nitride laser diodes grown by molecular beam epitaxy
title_full	Study of failure and degradation mechanisms of III-nitride laser diodes grown by molecular beam epitaxy
title_fullStr	Study of failure and degradation mechanisms of III-nitride laser diodes grown by molecular beam epitaxy
title_full_unstemmed	Study of failure and degradation mechanisms of III-nitride laser diodes grown by molecular beam epitaxy
title_sort	study of failure and degradation mechanisms of iii-nitride laser diodes grown by molecular beam epitaxy
publisher	University of Cambridge
publishDate	2009
url	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611245
work_keys_str_mv	AT xiuhuixin studyoffailureanddegradationmechanismsofiiinitridelaserdiodesgrownbymolecularbeamepitaxy
_version_	1718121687436754944

Study of failure and degradation mechanisms of III-nitride laser diodes grown by molecular beam epitaxy

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