The surface structure of semiconductors and some other material,s and its dependence on abrasion and other treatments
The present work forms a detailed study of the nature of the abrasion process during unidirectional abrasion of silicon and calcite single crystals. The surface orientations developed by unidirectional abrasion are investigated using electron diffraction. Beneath the abraded surface, composed of ran...
Main Author: | King, James Newington |
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Published: |
Imperial College London
1963
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Subjects: | |
Online Access: | https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.602235 |
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