Transmission electron microscope studies of silicon
Main Author: | Booker, G. R. |
---|---|
Published: |
University of Cambridge
1966
|
Subjects: | |
Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.596765 |
Similar Items
-
Electron microscope studies of ion implanted silicon
by: Fletcher, J.
Published: (1980) -
Electron microscope studies of oxygen implanted silicon
by: Christensen, K. N.
Published: (1990) -
The observation of magnetic domain structure in a transmission electron microscope
by: Morrison, G. R.
Published: (1981) -
Scanning transmission electron microscope studies of defects in diamond
by: Berger, S. D.
Published: (1984) -
Quantitative studies of thin foils in the transmission electron microscope
by: Rae, D. A.
Published: (1982)