The accuracy of filtered basis functions for the first principles modelling of defects in semiconductors
This work presents the results of calculations using filtered basis functions performed with the ab initio modelling program (AIMPRO). The filtration method works by projecting out (filtering) components of a reference basis function that are not required for a description of the occupied states, th...
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University of Newcastle upon Tyne
2013
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Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.588261 |