The accuracy of filtered basis functions for the first principles modelling of defects in semiconductors

This work presents the results of calculations using filtered basis functions performed with the ab initio modelling program (AIMPRO). The filtration method works by projecting out (filtering) components of a reference basis function that are not required for a description of the occupied states, th...

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Bibliographic Details
Main Author: Shrif, Fadil Ezzedin Irhoma
Published: University of Newcastle upon Tyne 2013
Subjects:
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.588261