Investigation of narrow gap dilute nitride materials for mid-infrared optoelectronic devices
This project investigates dilute nitrides such as InAsN and InGaAsN with a view to the fabrication of optoelectronic sources and detectors operating in the mid-infrared (2-5 um) spectral range which has many practical applications. Samples of both bulk epitaxial layers and state-of-the-art nanostruc...
Main Author: | de la Mare, Martin Ian |
---|---|
Published: |
Lancaster University
2011
|
Subjects: | |
Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.587052 |
Similar Items
-
Optoelectronic characterisation of III-V antimonide and nitride alloys grown on GaAs
by: Tan, Siew Li
Published: (2012) -
High-pressure Raman scattering studies on the vibrational properties of dilute nitrides
by: Jackson, Mark P.
Published: (2008) -
Non-linear electron dynamics in semiconductor superlattices and dilute nitride alloys
by: Fowler, Daivid Robert
Published: (2005) -
Long wavelength spectroscopy of charge dynamics and spin dependent processes in optoelectronic materials
by: Clarke, Damien Geoffrey
Published: (2003) -
Ultrafast optoelectronic measurement techniques
by: Alleston, S. B.
Published: (2005)