Titanium contacts on N-type silicon

The current transport mechanism usually assumed to be valid for metal silicon Schottky barriers is thermionic-emission. However, Crowell and Beguwala, using a thermionic-diffusion model, suggested that significant deviations from the behaviour predicted by the thermionic-emission theory shonld be ob...

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Bibliographic Details
Main Author: Wilkinson, John Malcolm
Published: Middlesex University 1974
Subjects:
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.568459