Characterization of A1GaN and InGaN thin films and quantum wells by analytical transmission electron microscopy

Characterization of A1GaN and InGaN thin films and quantum wells by analytical transmission electron microscopy

Bibliographic Details
Main Author:	Amari, Houari
Published:	University of Sheffield 2011
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.548647

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