A study of terabit per square inch scanning probe phase change memory
Scanning electrical probe-based storage using phase change materials is considered as a promising data storage technology due to its potential to meet future needs for ultra-high areal density, low-power, non-volatility, and rewritability. It is therefore important to understand and model the write,...
Main Author: | Wang, Lei |
---|---|
Other Authors: | Wright, David |
Published: |
University of Exeter
2009
|
Subjects: | |
Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.545563 |
Similar Items
-
Micro scanning probes
by: Niblock, Trevor
Published: (2001) -
Probing the resistance switching mechanism in silicon suboxide memory devices
by: Buckwell, Mark
Published: (2018) -
The design of active elements for electronically scanned phased array antennas
by: Austin, J.
Published: (1978) -
Code comparisons using mean square error criterion
by: Travers, Brian Lake
Published: (1968) -
Microwave Reflector Antennas for Limited Beam Scanning
by: Tong, G.
Published: (1977)