Characterisation of Electron Traps in Gate Dielectrics for Flash Memory Applications

Characterisation of Electron Traps in Gate Dielectrics for Flash Memory Applications

Bibliographic Details
Main Author:	Zheng, Xuefeng
Published:	Liverpool John Moores University 2009
Subjects:	621.3
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.515364

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