Investigations of the properties of microstrip transmission lines

• Main Author: Babu, Gurram Ravindra
• Published: Imperial College London 1969
• Subjects: 621.319
• Online Access: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.502498

In this thesis, new theoretical and practical methods leading to the determination of the basic properties of the microstrip lines are investigated including a coupled line element. general survey of the different theoretical methods of analysis of the transmission line problems with particular reference to microstrip line is attempted in Chapter 2. Chapter 3 considers the particular method of calculating the static capacitance and hence the characteristic impedance and phase constant of the narrow microstrips. The strip width is assumed to be equal. to the width of the equipotential surface which encloses two or three equidistant equal line charges and the potential field due to the infinite images formed by the multilayer boundary surface is determined. Results for different dielectric substates and for different geometries of-w/h are given. Chapter 4 introduces the measurement technique on the single microstrip line and deals with the evaluation of Zo and λg from the the measured scattering matrix coefficients of the junction. Chapter 5 deals with the coupled line properties and measurements. A new technique of measurement of the even and odd mode characteristic 3 impedances, attenuation and phase constants from scattering cooeficients is described.