Development and testing of a micromachined probe card

This thesis is concerned with the design, fabrication and testing of micro scale probes. The probes were designed to act as temporary electrical connections to allow wafer level testing of integrated circuits. The work initially focused on the creation of free standing nickel cantilevers, angled up...

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Main Author: Rosamond, Mark
Published: Durham University 2009
Subjects:
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.500770
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spelling ndltd-bl.uk-oai-ethos.bl.uk-5007702016-11-18T03:21:20ZDevelopment and testing of a micromachined probe cardRosamond, Mark2009This thesis is concerned with the design, fabrication and testing of micro scale probes. The probes were designed to act as temporary electrical connections to allow wafer level testing of integrated circuits. The work initially focused on the creation of free standing nickel cantilevers, angled up from the substrate with probe tips at the free end. These were fabricated using a novel method, combining pseudo grey scale lithography and thick photoresist sacrificial layers. Detailed analysis of the fabrication method, in particular the resist processing and lithography was undertaken and the limitations of the method explored.621.381548Durham Universityhttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.500770http://etheses.dur.ac.uk/1957/Electronic Thesis or Dissertation
collection NDLTD
sources NDLTD
topic 621.381548
spellingShingle 621.381548
Rosamond, Mark
Development and testing of a micromachined probe card
description This thesis is concerned with the design, fabrication and testing of micro scale probes. The probes were designed to act as temporary electrical connections to allow wafer level testing of integrated circuits. The work initially focused on the creation of free standing nickel cantilevers, angled up from the substrate with probe tips at the free end. These were fabricated using a novel method, combining pseudo grey scale lithography and thick photoresist sacrificial layers. Detailed analysis of the fabrication method, in particular the resist processing and lithography was undertaken and the limitations of the method explored.
author Rosamond, Mark
author_facet Rosamond, Mark
author_sort Rosamond, Mark
title Development and testing of a micromachined probe card
title_short Development and testing of a micromachined probe card
title_full Development and testing of a micromachined probe card
title_fullStr Development and testing of a micromachined probe card
title_full_unstemmed Development and testing of a micromachined probe card
title_sort development and testing of a micromachined probe card
publisher Durham University
publishDate 2009
url http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.500770
work_keys_str_mv AT rosamondmark developmentandtestingofamicromachinedprobecard
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