The Push-out Effect in Silicon Investigated by Electrical and Radiotracer Techniques

The Push-out Effect in Silicon Investigated by Electrical and Radiotracer Techniques

Bibliographic Details
Main Author:	Jones, C. L.
Published:	University of Southampton 1974
Subjects:	530.41
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.461090

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