$Characterisation of nitride thin films by electron backscattered diffraction correlated with cathodoluminescence spectroscopy and imaging$

Characterisation of nitride thin films by electron backscattered diffraction correlated with cathodoluminescence spectroscopy and imaging

Bibliographic Details
Main Author:	Sweeney, Francis
Published:	University of Strathclyde 2006
Subjects:	530.4175
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.426303

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