Characterisation of silicon-germanium heterostructures by kelvin force microscopy

Characterisation of silicon-germanium heterostructures by kelvin force microscopy

Bibliographic Details
Main Author: Ferguson, Ryan Sean
Published: Imperial College London 2003
Subjects:
621.38152
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.407665
id ndltd-bl.uk-oai-ethos.bl.uk-407665
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spelling ndltd-bl.uk-oai-ethos.bl.uk-4076652015-03-19T10:08:24ZCharacterisation of silicon-germanium heterostructures by kelvin force microscopyFerguson, Ryan Sean2003621.38152Imperial College Londonhttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.407665Electronic Thesis or Dissertation
collection NDLTD
sources NDLTD
topic 621.38152
spellingShingle 621.38152
Ferguson, Ryan Sean
Characterisation of silicon-germanium heterostructures by kelvin force microscopy
author Ferguson, Ryan Sean
author_facet Ferguson, Ryan Sean
author_sort Ferguson, Ryan Sean
title Characterisation of silicon-germanium heterostructures by kelvin force microscopy
title_short Characterisation of silicon-germanium heterostructures by kelvin force microscopy
title_full Characterisation of silicon-germanium heterostructures by kelvin force microscopy
title_fullStr Characterisation of silicon-germanium heterostructures by kelvin force microscopy
title_full_unstemmed Characterisation of silicon-germanium heterostructures by kelvin force microscopy
title_sort characterisation of silicon-germanium heterostructures by kelvin force microscopy
publisher Imperial College London
publishDate 2003
url http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.407665
work_keys_str_mv AT fergusonryansean characterisationofsilicongermaniumheterostructuresbykelvinforcemicroscopy
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