Characterisation of strained silicon / silicon germanium metal-oxide-semiconductor devices

Bibliographic Details
Main Author:	Kwa, Kelvin Sian Kiat
Published:	University of Newcastle Upon Tyne 2004
Subjects:	621.3815284
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.405358

id	ndltd-bl.uk-oai-ethos.bl.uk-405358
record_format	oai_dc
spelling	ndltd-bl.uk-oai-ethos.bl.uk-4053582015-03-19T06:34:49ZCharacterisation of strained silicon / silicon germanium metal-oxide-semiconductor devicesKwa, Kelvin Sian Kiat2004621.3815284University of Newcastle Upon Tynehttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.405358Electronic Thesis or Dissertation
collection	NDLTD
sources	NDLTD
topic	621.3815284
spellingShingle	621.3815284 Kwa, Kelvin Sian Kiat Characterisation of strained silicon / silicon germanium metal-oxide-semiconductor devices
author	Kwa, Kelvin Sian Kiat
author_facet	Kwa, Kelvin Sian Kiat
author_sort	Kwa, Kelvin Sian Kiat
title	Characterisation of strained silicon / silicon germanium metal-oxide-semiconductor devices
title_short	Characterisation of strained silicon / silicon germanium metal-oxide-semiconductor devices
title_full	Characterisation of strained silicon / silicon germanium metal-oxide-semiconductor devices
title_fullStr	Characterisation of strained silicon / silicon germanium metal-oxide-semiconductor devices
title_full_unstemmed	Characterisation of strained silicon / silicon germanium metal-oxide-semiconductor devices
title_sort	characterisation of strained silicon / silicon germanium metal-oxide-semiconductor devices
publisher	University of Newcastle Upon Tyne
publishDate	2004
url	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.405358
work_keys_str_mv	AT kwakelvinsiankiat characterisationofstrainedsiliconsilicongermaniummetaloxidesemiconductordevices
_version_	1716750740425277440

Characterisation of strained silicon / silicon germanium metal-oxide-semiconductor devices

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