Specular and diffuse X-ray scattering studies of surfaces and interfaces
The behaviour of thin film semiconducting and magnetic devices depends upon the chemical and physical status of the as-grown structure. Since the dimensions of many devices can be in the Angstrom and nanometre region, characterisation techniques capable of measuring chemical and physical parameters...
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Durham University
1994
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.387368 |