Some electronic properties of thin dielectric oxide films containing cerium, niobium, vanadium and silicon

Some electronic properties of thin dielectric oxide films containing cerium, niobium, vanadium and silicon

Bibliographic Details
Main Author:	Mian, A. R.
Published:	Brunel University 1988
Subjects:	530.41 Optical properties/thin films
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.384096

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