Alpha-particle-induced soft errors in MOS RAMS
Main Author: | Carter, P. M. |
---|---|
Published: |
University of Southampton
1987
|
Subjects: | |
Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.377793 |
Similar Items
-
Self test and self repair strategies in VLSI architectures for high speed digital correlation
by: Blackley, William Sinclair
Published: (1985) -
Excess noise in ohmic MOS transistors
by: Hayat, S. A.
Published: (1986) -
Generation-recombination measurements in silicon M.O.S. capacitors
by: Ibrahim, Zainol Abidin
Published: (1983) -
Electrical overstress and electrostatic discharge failure in silicon MOS devices
by: Tunnicliffe, Martin James
Published: (1993) -
Minority carrier effects in small geometry MOS devices
by: Childs, P. A.
Published: (1984)