Fault-oriented testing of MOS circuits

Bibliographic Details
Main Author:	Burgess, N.
Published:	University of Southampton 1986
Subjects:	621.3192 Circuits
Online Access:	https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.372858

id	ndltd-bl.uk-oai-ethos.bl.uk-372858
record_format	oai_dc
spelling	ndltd-bl.uk-oai-ethos.bl.uk-3728582018-09-05T03:22:48ZFault-oriented testing of MOS circuitsBurgess, N.1986621.3192CircuitsUniversity of Southamptonhttps://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.372858https://eprints.soton.ac.uk/256260/Electronic Thesis or Dissertation
collection	NDLTD
sources	NDLTD
topic	621.3192 Circuits
spellingShingle	621.3192 Circuits Burgess, N. Fault-oriented testing of MOS circuits
author	Burgess, N.
author_facet	Burgess, N.
author_sort	Burgess, N.
title	Fault-oriented testing of MOS circuits
title_short	Fault-oriented testing of MOS circuits
title_full	Fault-oriented testing of MOS circuits
title_fullStr	Fault-oriented testing of MOS circuits
title_full_unstemmed	Fault-oriented testing of MOS circuits
title_sort	fault-oriented testing of mos circuits
publisher	University of Southampton
publishDate	1986
url	https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.372858
work_keys_str_mv	AT burgessn faultorientedtestingofmoscircuits
_version_	1718728547584966656

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