Self test and self repair strategies in VLSI architectures for high speed digital correlation

Bibliographic Details
Main Author: Blackley, William Sinclair
Published: University of Edinburgh 1985
Subjects:
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.370905
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spelling ndltd-bl.uk-oai-ethos.bl.uk-3709052016-04-25T15:16:58ZSelf test and self repair strategies in VLSI architectures for high speed digital correlationBlackley, William Sinclair1985621.31042Microchip designUniversity of Edinburghhttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.370905http://hdl.handle.net/1842/14106Electronic Thesis or Dissertation
collection NDLTD
sources NDLTD
topic 621.31042
Microchip design
spellingShingle 621.31042
Microchip design
Blackley, William Sinclair
Self test and self repair strategies in VLSI architectures for high speed digital correlation
author Blackley, William Sinclair
author_facet Blackley, William Sinclair
author_sort Blackley, William Sinclair
title Self test and self repair strategies in VLSI architectures for high speed digital correlation
title_short Self test and self repair strategies in VLSI architectures for high speed digital correlation
title_full Self test and self repair strategies in VLSI architectures for high speed digital correlation
title_fullStr Self test and self repair strategies in VLSI architectures for high speed digital correlation
title_full_unstemmed Self test and self repair strategies in VLSI architectures for high speed digital correlation
title_sort self test and self repair strategies in vlsi architectures for high speed digital correlation
publisher University of Edinburgh
publishDate 1985
url http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.370905
work_keys_str_mv AT blackleywilliamsinclair selftestandselfrepairstrategiesinvlsiarchitecturesforhighspeeddigitalcorrelation
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