Self test and self repair strategies in VLSI architectures for high speed digital correlation
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1985
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ndltd-bl.uk-oai-ethos.bl.uk-3709052016-04-25T15:16:58ZSelf test and self repair strategies in VLSI architectures for high speed digital correlationBlackley, William Sinclair1985621.31042Microchip designUniversity of Edinburghhttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.370905http://hdl.handle.net/1842/14106Electronic Thesis or Dissertation |
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621.31042 Microchip design |
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621.31042 Microchip design Blackley, William Sinclair Self test and self repair strategies in VLSI architectures for high speed digital correlation |
author |
Blackley, William Sinclair |
author_facet |
Blackley, William Sinclair |
author_sort |
Blackley, William Sinclair |
title |
Self test and self repair strategies in VLSI architectures for high speed digital correlation |
title_short |
Self test and self repair strategies in VLSI architectures for high speed digital correlation |
title_full |
Self test and self repair strategies in VLSI architectures for high speed digital correlation |
title_fullStr |
Self test and self repair strategies in VLSI architectures for high speed digital correlation |
title_full_unstemmed |
Self test and self repair strategies in VLSI architectures for high speed digital correlation |
title_sort |
self test and self repair strategies in vlsi architectures for high speed digital correlation |
publisher |
University of Edinburgh |
publishDate |
1985 |
url |
http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.370905 |
work_keys_str_mv |
AT blackleywilliamsinclair selftestandselfrepairstrategiesinvlsiarchitecturesforhighspeeddigitalcorrelation |
_version_ |
1718234418846367744 |