A study of the effects of radiation damage in GaAs MESFETs on device performance

A study of the effects of radiation damage in GaAs MESFETs on device performance

Bibliographic Details
Main Author: Chalapathi, K. M.
Published: University of Leeds 1985
Subjects:
530.41
Solid-state physics
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.355937

Internet

http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.355937

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