Long and short term effects of X-rays on charge coupled devices
EEV buried channel charge coupled devices (BC CDs) with technological variations have been studied with respect to their response to 70kVp X-rays. Process variations considered are the conventional BCCD, scintillator coated BCCDs (Gadox(Eu) and Csl(Tl)) and the inversion mode device. The work was ma...
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Brunel University
1996
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.340920 |