Modelling and analysis of failures in CMOS integrated cirucuits

Bibliographic Details
Main Author:	Johnson, Simon
Published:	Durham University 1993
Subjects:	621.31042 Circuit failure
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.335927

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spelling	ndltd-bl.uk-oai-ethos.bl.uk-3359272016-11-18T03:21:21ZModelling and analysis of failures in CMOS integrated cirucuitsJohnson, Simon1993621.31042Circuit failureDurham Universityhttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.335927http://etheses.dur.ac.uk/1562/Electronic Thesis or Dissertation
collection	NDLTD
sources	NDLTD
topic	621.31042 Circuit failure
spellingShingle	621.31042 Circuit failure Johnson, Simon Modelling and analysis of failures in CMOS integrated cirucuits
author	Johnson, Simon
author_facet	Johnson, Simon
author_sort	Johnson, Simon
title	Modelling and analysis of failures in CMOS integrated cirucuits
title_short	Modelling and analysis of failures in CMOS integrated cirucuits
title_full	Modelling and analysis of failures in CMOS integrated cirucuits
title_fullStr	Modelling and analysis of failures in CMOS integrated cirucuits
title_full_unstemmed	Modelling and analysis of failures in CMOS integrated cirucuits
title_sort	modelling and analysis of failures in cmos integrated cirucuits
publisher	Durham University
publishDate	1993
url	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.335927
work_keys_str_mv	AT johnsonsimon modellingandanalysisoffailuresincmosintegratedcirucuits
_version_	1718393609033613312

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