Spectral characterisation of devices at high frequencies and measurement methods
The properties of nonlinear devices, semiconductor diodes, were determined at high frequencies using the method of spectral characterisation. Such characterisation was carried out employing a specially developed technique where the components of the harmonic spectrum generated within these diodes at...
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Durham University
1984
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.332155 |