Studies of deep levels of semiconductors
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University of Cambridge
1987
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Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.329280 |
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ndltd-bl.uk-oai-ethos.bl.uk-3292802015-03-19T09:30:50ZStudies of deep levels of semiconductorsNash, Keith James1987530.41Semiconductor defect studiesUniversity of Cambridgehttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.329280Electronic Thesis or Dissertation |
collection |
NDLTD |
sources |
NDLTD |
topic |
530.41 Semiconductor defect studies |
spellingShingle |
530.41 Semiconductor defect studies Nash, Keith James Studies of deep levels of semiconductors |
author |
Nash, Keith James |
author_facet |
Nash, Keith James |
author_sort |
Nash, Keith James |
title |
Studies of deep levels of semiconductors |
title_short |
Studies of deep levels of semiconductors |
title_full |
Studies of deep levels of semiconductors |
title_fullStr |
Studies of deep levels of semiconductors |
title_full_unstemmed |
Studies of deep levels of semiconductors |
title_sort |
studies of deep levels of semiconductors |
publisher |
University of Cambridge |
publishDate |
1987 |
url |
http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.329280 |
work_keys_str_mv |
AT nashkeithjames studiesofdeeplevelsofsemiconductors |
_version_ |
1716770289000382464 |